
Sigray Unveils the Apex-Hybrid: A Breakthrough 3D X-Ray System for Failure Analysis (FA) and Electronics Reverse Engineering
Sigray, Inc., a pioneer in X-ray microscopy, proudly announces the launch of the Apex-Hybrid-a cutting-edge system developed to transform failure analysis (FA) workflows in semiconductor and electronics laboratories. With interchangeable laminography and tomography modes and outstanding 100nm pixel resolution (350nm spatial resolution), the Apex-Hybrid delivers